IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems , Austria

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems  provides a forum for exchanging ideas, discussing research results and presenting practical applications in the areas of design, test and diagnosis of microelectronic circuits and systems.

The DDECS Workshop/Symposium series is organised by Central European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008) and Hungary (2001,
2005). DDECS 2010 will, for the first time, take place in Vienna, the romantic yet vivid capital of Austria.

The Symposium is organised by the Vienna University of Technology and sponsored by the Test
Technology Technical Council (TTTC) of the IEEE Computer Society.

 Topic of Interest

·  ASIC/FPGA Design
·  Bio-inspired Hardware
·  Design Verification/Validation
·  Formal Methods in System Design
·  Hardware/Software Co-Design
·  IP-based Design
·  Logic Synthesis
·  Physical Design
·  ATE Hardware and Software
·  SoC Design and Test
·  Built-in Self-Test and Self-Repair
·  Design for Testability and Diagnosis
·  Defect/Fault Tolerance and Reliability
·  On-line Testing
·  Embedded Systems Testing
·  Memory, Processor Testing
·  MEMS Testing
·  Design and Test in Nano-Technologies
·  Educational Tools for Design and Test

Important dates:

Submission deadline:	January 10, 2010
Notification of acceptance:	February 26, 2010

Conference homepage:

Submission deadline: 10 January 2010

Conference location: , Austria

Organised by:

Contact Name:

Contact Email:

Posted on 2009-12-19 22:38:46, Report Update

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