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Conference on Precision Electromagnetic Measurements (CPEM), June 13-18, 2020, South Korea

The CPEM (Conference on Precision Electromagnetic Measurements) is devoted to topics related to the measurement of electromagnetic quantities at the highest accuracy levels. These cover the frequency spectrum from dc to the optical region. A major focus of this conference is quantum devices that relate electrical standards to fundamental constants and the international system of units. In response to the global climate change challenges, metrology for energy and environment will be presented as a special topic for discussion.

CPEM attracts a highly specialized international participation. The principal types of organizations that participate in CPEM are the national standards laboratories; industrial organizations that manufacture electrical standards and measurement instruments; industrial and government laboratories that interact extensively with national laboratories; and universities that conduct research on precision measurements, standards and related fundamental constants.

Attendance at CPEM is considered a must for the researchers and metrologists who are interested in electromagnetic measurement technology and its applications.

CPEM 2010, hosted by Korea Research Institute of Standards and Science (KRISS), is the 27th event in a series of international conferences that began in 1958 in Boulder, Colorado, USA. It will provide a forum for the discussion of present research and development activities and future prospects.

The CPEM 2010 technical program will consist of oral and poster sessions including a number of invited presentations by leading scientists working at the frontiers of measurement science and technology. This conference will contribute to further development of related fields.

Call for Papers

Papers describing original work within the scope of the conference are invited. Two-page summary papers (A4 size) in MS-Word format should be submitted through the conference
web site from November 2009. Guidelines for preparing and submitting manuscripts will be available on the web site.

All papers will be reviewed by the Technical Committee, and those accepted will be assigned for either oral or poster presentation. Accepted submissions will be published in the Conference Digest.

Authors will be notified of summary-paper acceptance by March 12, 2010 and will receive instructions concerning their presentations. Authors will be encouraged to submit extended papers to the special issue of the IEEE Transactions on Instrumentation and Measurement journal.

Conference homepage: http://www.cpem2010.org

Submission deadline: 31 January 2010

Conference location: , South Korea

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Posted on 2010-01-24 08:47:46, Report Update

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